{
  "resourceType": "StructureDefinition",
  "url": "http://oped.de/orthelligent/fhir/StructureDefinition/OrthelligentTestFitIndex",
  "name": "OrthelligentTestFitIndex",
  "status": "draft",
  "fhirVersion": "4.0.1",
  "mapping": [
    {
      "identity": "workflow",
      "uri": "http://hl7.org/fhir/workflow",
      "name": "Workflow Pattern"
    },
    {
      "identity": "sct-concept",
      "uri": "http://snomed.info/conceptdomain",
      "name": "SNOMED CT Concept Domain Binding"
    },
    {
      "identity": "v2",
      "uri": "http://hl7.org/v2",
      "name": "HL7 v2 Mapping"
    },
    {
      "identity": "rim",
      "uri": "http://hl7.org/v3",
      "name": "RIM Mapping"
    },
    {
      "identity": "w5",
      "uri": "http://hl7.org/fhir/fivews",
      "name": "FiveWs Pattern Mapping"
    },
    {
      "identity": "sct-attr",
      "uri": "http://snomed.org/attributebinding",
      "name": "SNOMED CT Attribute Binding"
    }
  ],
  "kind": "resource",
  "abstract": false,
  "type": "Observation",
  "baseDefinition": "http://oped.de/orthelligent/fhir/StructureDefinition/OrthelligentFitIndex",
  "derivation": "constraint",
  "differential": {
    "element": [
      {
        "id": "Observation.derivedFrom",
        "path": "Observation.derivedFrom",
        "short": "TestResults",
        "definition": "A test fit index is always calculated from either two atomic test measurement values, or a value and a reference value.",
        "min": 2,
        "max": "2",
        "type": [
          {
            "code": "Reference",
            "targetProfile": [
              "http://oped.de/orthelligent/fhir/StructureDefinition/OrthelligentTestResult"
            ]
          }
        ]
      }
    ]
  }
}